ALEXANDRIA, Va., Sept. 8 -- United States Patent no. 12,730,138, issued on Sept. 8, was assigned to NTT Inc. (Tokyo). "Electric field distribution fluctuation period measuring method and electric fie... Read More
ALEXANDRIA, Va., Sept. 8 -- United States Patent no. 12,730,139, issued on Sept. 8, was assigned to CONTEMPORARY AMPEREX TECHNOLOGY (HONG KONG) Ltd. (Hong Kong). "Detection apparatus and target detec... Read More
ALEXANDRIA, Va., Sept. 8 -- United States Patent no. 12,730,141, issued on Sept. 8, was assigned to Raytheon Co. (Tewksbury, Mass.). "Event detection system response controller" was invented by Grego... Read More
ALEXANDRIA, Va., Sept. 8 -- United States Patent no. 12,730,142, issued on Sept. 8, was assigned to Kioxia Corp. (Tokyo). "Test substrate, test apparatus, and test method for semiconductor integrated... Read More
ALEXANDRIA, Va., Sept. 8 -- United States Patent no. 12,730,143, issued on Sept. 8, was assigned to FormFactor Inc. (Livermore, Calif.). "Probe systems and methods of operating probe systems" was inv... Read More
ALEXANDRIA, Va., Sept. 8 -- United States Patent no. 12,730,144, issued on Sept. 8, was assigned to Marvell Israel (M.I.S.L) Ltd. (Yokneam, Israel). "Physical layer parameter compliance in high speed... Read More
ALEXANDRIA, Va., Sept. 8 -- United States Patent no. 12,730,145, issued on Sept. 8, was assigned to TECHWIDU Co. LTD. (Suwon-si, South Korea). "Test circuit having separately arranged digital and ana... Read More
ALEXANDRIA, Va., Sept. 8 -- United States Patent no. 12,730,146, issued on Sept. 8, was assigned to Skyworks Solutions Inc. (Irvine, Calif.). "Sub-sampled based instrument noise correction for jitter... Read More
ALEXANDRIA, Va., Sept. 8 -- United States Patent no. 12,730,147, issued on Sept. 8, was assigned to Winbond Electronics Corp. (Taichung City, Taiwan). "Testing circuit for testing electrical devices ... Read More
ALEXANDRIA, Va., Sept. 8 -- United States Patent no. 12,730,148, issued on Sept. 8, was assigned to NVIDIA Corp. (Santa Clara, Calif.). "Low power and area clock monitoring circuit using ring delay a... Read More